Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies

Authors: Briec W.¹; Kerstens K.²; Leleu H.²; Eeckaut P.V.³

Source: Journal of Productivity Analysis, Volume 14, Number 3, November 2000 , pp. 267-274(8)

Publisher: Springer

Abstract:

The purpose of this short article is to simplify goodness-of-fit methods to obtain qualitative information about returns to scale for individual observations. Traditional and new goodness-of-fit methods developed for estimating returns to scale on nonparametric deterministic reference technologies are reviewed. Using composition rules for technologies with specific returns to scale assumptions, we show how these goodness-of-fit methods can be simplified in the case of convex technologies (Data Envelopment Analysis (DEA) models).

Keywords: Returns to scale; DEA; FDH

Language: English

Document Type: Regular paper

Affiliations: 1: CREREG & JEREM, Université de Perpignam, 54 Avenue Villeneuve, F-66000 Perpignan, France 2: LABORES, Université Catholique de Lille, 60 Boulevard Vauban, B.P. 109, F-59016 Lille Cédex, France 3: Institut de Statistique, Université Catholique de Louvain, Voie du Roman Pays 20, B-1348 Louvain-la-Neuve, Belgium

Publication date: 2000-11-01

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• By this author: Briec W. ;  Kerstens K. ;  Leleu H. ;  Eeckaut P.V.

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