Inference from Accelerated Degradation and Failure Data Based on Gaussian Process Models

Authors: Padgett W.J.¹; Tomlinson M.A.²

Source: Lifetime Data Analysis, Volume 10, Number 2, June 2004 , pp. 191-206(16)

Publisher: Springer

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Abstract:

An important problem in reliability and survival analysis is that of modeling degradation together with any observed failures in a life test. Here, based on a continuous cumulative damage approach with a Gaussian process describing degradation, a general accelerated test model is presented in which failure times and degradation measures can be combined for inference about system lifetime. Some specific models when the drift of the Gaussian process depends on the acceleration variable are discussed in detail. Illustrative examples using simulated data as well as degradation data observed in carbon-film resistors are presented.

Keywords: inverse Gaussian distribution; accelerated life test; degradation process; Fisher information; power law; Arrhenius model; censoring

Document Type: Research article

DOI: http://dx.doi.org/10.1023/B:LIDA.0000030203.49001.b6

Affiliations: 1: Department of Statistics, University of South Carolina, Columbia SC 29208, USA 2: Department of Mathematics, Winthrop University, Rock Hill SC 29733, USA

Publication date: 2004-06-01