Synchrotron X-ray Based Characterization of CdZnTe Crystals
Authors: Duff, Martine; Hunter, Douglas; Nuessle, Patterson; Black, David; Burdette, Harold; Woicik, Joseph; Burger, Arnold; Groza, Michael
Source: Journal of Electronic Materials, Volume 36, Number 8, August 2007 , pp. 1092-1097(6)
Abstract:Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.
Document Type: Research Article
Affiliations: Email: email@example.com
Publication date: August 2007