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Electronic Materials", volume = "36", number = "3", year = "2007", pages = "197-206", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000093", doi = "doi:10.1007/s11664-007-0093-9" } @article {Jang:2007:0361-5235:207, author = "Jang, J.W. and Lin, J.K. and Frear, D.R.", title = "Failure Morphology after the Drop Impact Test of the Ball Grid Array Package with Lead-Free Sn-3.8Ag-0.7Cu on Cu and Ni Under-Bump Metallurgies", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "207-213", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000089", doi = "doi:10.1007/s11664-007-0089-5" } @article {Williams:2007:0361-5235:214, author = "Williams, M.E. and Moon, K.-W. and Boettinger, W.J. and Josell, D. and Deal, A.D.", title = "Hillock and Whisker Growth on Sn and SnCu Electrodeposits on a Substrate Not Forming Interfacial Intermetallic Compounds", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "214-219", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000071", doi = "doi:10.1007/s11664-006-0071-7" } @article {Moriuchi:2007:0361-5235:220, author = "Moriuchi, Hiroyuki and Tadokoro, Yoshihiro and Sato, Masahide and Furusawa, Takeshi and Suzuki, Noboru", title = "Microstructure of External Stress Whiskers and Mechanical Indentation Test Method", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "220-225", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000030", doi = "doi:10.1007/s11664-006-0030-3" } @article {Lam:2007:0361-5235:226, author = "Lam, D.C.C. and Wang, J.", title = "Hygrothermal Delaminations in Lead-Free Solder Reflow of Electronic Packages", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "226-231", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000088", doi = "doi:10.1007/s11664-007-0088-6" } @article {NOUSIAINEN:2007:0361-5235:232, author = "NOUSIAINEN, O. and PUTAALA, J. and KANGASVIERI, T. and RAUTIOAHO, R. and VAHAKANGAS, J.", title = "Failure Mechanisms of Thermomechanically Loaded SnAgCu/Plastic Core Solder Ball Composite Joints in Low-Temperature Co-Fired Ceramic/Printed Wiring Board Assemblies", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "232-241", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000066", doi = "doi:10.1007/s11664-006-0066-4" } @article {Bhattacharya:2007:0361-5235:242, author = "Bhattacharya, Swapan and Varadarajan, Mahesh and Chahal, Premjeet and Jha, Gopal and Tummala, Rao", title = "A Novel Electroless Process for Embedding a Thin Film Resistor on the Benzocyclobutene Dielectric", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "242-244", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000058", doi = "doi:10.1007/s11664-006-0058-4" } @article {Hung:2007:0361-5235:245, author = "Hung, Kun and Hsieh, Ching and Yang, Wein and Tsai, Hui", title = "Synthesis of Nanometric-Sized Barium Titanate Powders Using Acetylacetone as the Chelating Agent in a Sol-Precipitation Process", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "245-252", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000027", doi = "doi:10.1007/s11664-006-0027-y" } @article {Ding:2007:0361-5235:253, author = "Ding, Shi-Jin and Zhang, Min and Chen, Wei and Zhang, David and Wang, Li-Kang", title = "Memory Effect of Metal-Insulator-Silicon Capacitor with HfO2-Al2O3 Multilayer and Hafnium Nitride Gate", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "253-257", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000003", doi = "doi:10.1007/s11664-006-0003-6" } @article {Tsukimoto:2007:0361-5235:258, author = "Tsukimoto, S. and Kabe, T. and Ito, K. and Murakami, M.", title = "Effect of Annealing Ambient on the Self-Formation Mechanism of Diffusion Barrier Layers Used in Cu(Ti) Interconnects", journal = "Journal of Electronic Materials", volume = "36", number = "3", year = "2007", pages = "258-265", url = "http://www.ingentaconnect.com/content/klu/jem/2007/00000036/00000003/00000094", doi = "doi:10.1007/s11664-007-0094-8" }