Interfacial Reaction between 42Sn-58Bi Solder and Electroless Ni-P/Immersion Au Under Bump Metallurgy during Aging

Authors: Cho, Moon Gi; Paik, Kyung Wook; Lee, Hyuck Mo; Booh, Seong Woon; Kim, Tae-Gyu

Source: Journal of Electronic Materials, Volume 35, Number 1, January 2006 , pp. 35-40(6)

Publisher: Springer

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Abstract:

The interfacial reaction between 42Sn-58Bi solder (in wt.% unless specified otherwise) and electroless Ni-P/immersion Au was investigated before and after thermal aging, with a focus on the formation and growth of an intermetallic compound layer, consumption of under bump metallurgy (UBM), and bump shear strength. The immersion Au layer with thicknesses of 0 μm (bare Ni), 0.1 μm, and 1 μm was plated on a 5-μm-thick layer of electroless Ni-P (with 14–15 at.% P). The 42Sn-58Bi solder balls were then fabricated on three different UBM structures by using screen printing and pre-reflow. A Ni₃Sn₄ layer formed at the joint interface after the pre-reflow for all three UBM structures. On aging at 125°C, a quaternary phase, identified as Sn₇₇Ni₁₅Bi₆Au₂, was observed above the Ni₃Sn₄ layer in the UBM structures that contain Au. The thick Sn₇₇Ni₁₅Bi₆Au₂ layer degraded the integrity of the solder joint, and the shear strength of the solder bump was about 40% less than the nonaged joints.

Keywords: SN-BI SOLDER BUMP; IMMERSION AU UNDER BUMP METALLURGY (UBM); SN77NI15BI6AU2 PHASE; CONSUMPTION OF UBM; SOLID-STATE AGING

Document Type: Research article

Publication date: 2006-01-01