Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4
Authors: Boettinger, W.J.; Vaudin, M.D.; Williams, M.E.; Bendersky, L.A.; Wagner, W.R.
Source: Journal of Electronic Materials, Volume 32, Number 6, 1 June 2003 , pp. 511-515(5)
Abstract:Electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) have been performed on a plate-shaped phase formed through the reaction of Sn and Ni. The phase is formed during extended thermal cycling tests on ceramic capacitors having electroplated tin end terminations. The morphology is identical to that of a phase labeled NiSn3 by J. Haimovich. The phase is shown to have a stoichiometry, NiSn4, and a crystal structure isomorphous to PdSn4, PtSn4, and AuSn4 (Aba2, #41, oC20). The structure can also be described with the higher symmetry structure (Ccca, #68, oC20).
Document Type: Miscellaneous
Publication date: June 1, 2003