Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4

Authors: Boettinger, W.J.; Vaudin, M.D.; Williams, M.E.; Bendersky, L.A.; Wagner, W.R.

Source: Journal of Electronic Materials, Volume 32, Number 6, 1 June 2003 , pp. 511-515(5)

Publisher: Springer

Buy & download fulltext article:


Price: $47.00 plus tax (Refund Policy)


Electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) have been performed on a plate-shaped phase formed through the reaction of Sn and Ni. The phase is formed during extended thermal cycling tests on ceramic capacitors having electroplated tin end terminations. The morphology is identical to that of a phase labeled NiSn3 by J. Haimovich. The phase is shown to have a stoichiometry, NiSn4, and a crystal structure isomorphous to PdSn4, PtSn4, and AuSn4 (Aba2, #41, oC20). The structure can also be described with the higher symmetry structure (Ccca, #68, oC20).


Document Type: Miscellaneous

Publication date: June 1, 2003

Related content


Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page