XPS and ellipsometric characterization of zinc-BTA complex
Authors: Sirtori, V.; Zambon, F.; Lombardi, L.
Source: Journal of Electronic Materials, Volume 29, Number 4, April 2000 , pp. 463-467(5)
Abstract:This paper describes the study of the reaction of zinc with solutions of benzotriazole in alcohol medium. It was found using XPS and Ellipsometry that this reaction creates an overlayer of about 0.5 nanometer of Zn++ (BTA−)2 on the zinc surface. Good agreement was found on the overlayer thickness between the ellipsometry results and the XPS peak intensities calculated with the model of Seah. The greater stability of Zn++ (BTA−)2 with respect to metallic zinc (+1.7 eV) and ZnO (+ 0.83 eV) provides good protection of the zinc against oxidation, reducing the corrosion current by about 40%. This results makes possible the application of the treatment of zinc with benzotriazole not only in electronics, but also in other industrial applications such electromechanic engineering and building construction.
Document Type: Research Article
Affiliations: Email: Vittorio_Sirtori@it.ibm.com
Publication date: April 1, 2000