@article {Bieg:2000:0361-5235:231,
	author = "Bieg, B. and Cederberg, J. and Kuech, T.",
	title = "High-temperature hysteretic electronic effects of (AlxGa1x)0.5In0.5P (x0.65)",
	journal = "Journal of Electronic Materials",
	volume = "29",
	number = "2",
	year = "2000",
	abstract = "We have studied (Al<SUB>x</SUB>Ga<SUB>1&#8722;x</SUB>)<SUB>0.5</SUB>In<SUB>0.5</SUB>P doped with tellurium using deep level transient spectroscopy and associated electrical measurements. Several defect states are observed in the upper half of the band gap, that are believed to be intrinsic to the alloy system as well as related to the tellurium donors. Defects observed at measurement temperatures above 390 K exhibit a hysteretic behavior. The observed spectra depend on the biasing conditions applied to the Schottky diode during cooling. The hysteretic behavior suggests the existence of different defect configurations, which can be accessed under conditions of high temperatures and electrical stress, but remain stable below 300 K.",
	pages = "231-236",
	url = "http://www.ingentaconnect.com/content/klu/jem/2000/00000029/00000002/00000148",
	doi = "doi:10.1007/s11664-000-0148-7",
	keyword = "Hystersis, deep level transient spectroscopy, (AlGa)InP, electrical properties, defects"
}