IngentaConnect Defect Chemistry of \hbox{SrBi}_{2}\hbox{Ta}_{2}\hbox{O}

Abstract:

The defect chemistry and charge transport properties of doped and undoped \hbox{SrBi}_{2}\hbox{Ta}_{2}\hbox{O}_{9} (SBT) were studied by making 4-point dc equilibrium electrical conductivity, thermopower, ionic transport number, X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) measurements. Results of high temperature equilibrium dc conductivity, thermoelectric power, and transport number measurements as a function of oxygen activity in the temperature range 650–725°C revealed that undoped SBT displays a broad centrally located plateau of ionic conductivity with an activation energy of mobility of 0.94 eV and a prominent upturn at high oxygen activity, caused by p-type conductivity. The effects of acceptor and donor dopants are consistent with a 1–2% net acceptor excess in the undoped compound. It has been observed that there is substantial (several percent) cation place exchange between the \hbox{Sr}^{2+} and \hbox{Bi}^{3+} in SBT. It is proposed that the net acceptor excess in undoped SBT consists of disordered \hbox{Sr}^{2+} substituting for \hbox{Bi}^{3+} in the fluorite-like bismuth oxide layers which are locally compensated by oxygen vacancies. The formation of the net donor excess by disordered \hbox{Bi}^{3+} substituting for \hbox{Sr}^{2+} in the perovskite-like layers does not manifest itself as n-type conductivity behavior, because the band gap is large and the mobility is highly thermally activated. The superior intrinsic ferroelectric fatigue endurance of SBT is attributed to the lack of mobile charged defects in the perovkite-like layers which create the ferroelectric response of the compound. The metallic bismuth presence on the surface of undoped SBT, as revealed by qualitative XPS measurements, is believed to result from long exposure to the highly reducing conditions in the XPS system.

Keywords: SBT; ferroelectric fatigue endurance; defect chemistry; cation place exchange; local charge compensation

Language: English

Document Type: Regular paper

Affiliations: 1: Materials Research Center, Lehigh University, 5 E. Packer Ave., Bethlehem, PA 18015, USA

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Defect Chemistry of \hbox{SrBi}_{2}\hbox{Ta}_{2}\hbox{O}_{9} and Ferroelectric Fatigue Endurance