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Volume 66, Number 11, November 2000

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Selective Membrane Electrodes for Determination of Synthetic Surface-Active Substances (Review)
pp. 701-713(13)
Authors: Kulapina E.G.; Chernova R.K.; Kulapin A.I.; Mitrokhina S.A.

A Study of the Structural Characteristics of Fluorite Crystals Using Methods of X-Ray Diffractometry and Topography
pp. 726-728(3)
Authors: Kablis G.N.; Punegov V.I.; Shilov S.V.; Petrakov A.P.

An X-Ray Powder-Pattern Diffractometer with a Two-Dimensional Parallax-Free Proportional Chamber, a Sharp-Focusing X-Ray Tube, and a Focusing Collimator
pp. 729-733(5)
Authors: Kheiker D.M.; Andrianova M.E.; Sul'yanov S.N.; Dudkin S.S.; Zanevskii Y.V.; Fateev O.V.; Chernenko S.P.

Joint Account of Temperature and Humidity in a Constitutive Equation of Hereditary Type
pp. 746-749(4)
Authors: Nguen D.D.; Suvorova Y.V.; Alekseeva S.I.

An Estimator of the Linear Regression Coefficients with Additional Constraints
pp. 761-764(4)
Authors: Mikhailov V.N.; Kharlamov A.V.

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