Industrial Laboratory

X-Ray Fluorescence Analysis: State-of-the-Art and Trends of Development (Review)
pp. 637-652(16)
Author: Revenko A.G.

Spectrophotometric Flow-Injection Determination of p-Aminophenol in Mixtures
pp. 653-656(4)
Authors: Evgen'ev M.I.; Garmonov S.Y.; Shakirova L.S.

Infrared Tomography of the Lifetime and the Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots
pp. 657-662(6)
Authors: Akhmetov V.D.; Fateev N.V.

A Microwave Method for Determination of the Recombination Rate of Nonequilibrium Charge Carriers in the Bulk and at the Surface of Doped Silicon Wafers
pp. 663-665(3)
Author: Koshelev O.G.

Diagnostics of Silicon Wafers Based on Measurement of Parameters and Thermal Radiation of Solar Cells
pp. 666-668(3)
Authors: Kontsevoi Y.A.; Brashevan Y.V.; Zavadskii Y.I.; Maksimov Y.A.; Gladyshev D.A.; Chernokozhin V.V.

A Contactless Device for Determining the Lifetime of Minor Charge Carriers in Silicon Wafers with p–n-Junctions
pp. 669-670(2)
Authors: Koshelev O.G.; Morozova V.A.

Oxidation Test as a Method of Quality Control in the Production of Czochralsky Single-Crystal Silicon
pp. 671-673(3)
Authors: Votintseva E.E.; Grinshtein N.M.; Kravtsov A.A.

An X-Ray Fluorescence Method for Determining the Average Density of Thin Films
pp. 674-675(2)
Authors: Trushin O.S.; Bochkarev V.F.; Goryachev A.A.; Naumov V.V.; Lebedev A.A.

Applicability of Approximate Equations to the Shape Analysis of Fatigue Curves
pp. 676-686(11)
Authors: Borisov Y.S.; Blagoveshchenskii Y.N.; Dmitrichenko S.S.; Pankratov N.M.

Mechanical Behavior of Polymer Specimens Subjected to Alternate Cyclic Loading
pp. 687-689(3)
Author: Odinokova O.A.

Qualimetry of Materials Based on Twisting Test at High Temperatures
pp. 690-696(7)
Author: Migachev B.A.

Sampling Techniques for Analytical Monitoring of the Atmospheric Environment and Industrial Emissions
pp. 697-699(3)
Authors: Khobotova O.M.; Prokhorova E.K.