On Origin of Surface Resistance Degradation of YBa2Cu3O7- Films in Millimeter Waveband
Author: Poustylnik O.D.
Source: International Journal of Infrared and Millimeter Waves, Volume 21, Number 4, April 2000 , pp. 647-653(7)
Measuring data of the surface resistance R_s(T) temperature dependence of YBa_2Cu_3O_7-δ epitaxial films on sapphire substrates are reported. The films were prepared by impulse laser ablation technique. Surface impedance measuring was made in 65 GHz frequency range. We shown that R_s(T) are in accordance with epitaxial film considering the existence of spatial inhomogeneities as normal spherical domains. The analysis of YBa_2Cu_3O_7-δ film contamination was made by a laser mass-spectrometry technique. It was shown that normal spherical domains of YBa_2Cu_3O_7-δ films include oxidizer cooper compounds filling cluster voids and film edges. The measuring was made for a set of samples, which have a different history (technology regimes, critical parameters and geometry).
Document Type: Regular paper
Publication date: 2000-04-01