Product-mix decision in a mixed-yield wafer fabrication scenario
Authors: Wu, M.-C.; Chang, W.-J.; Chiou, C.-W.
Source: The International Journal of Advanced Manufacturing Technology, Volume 29, Numbers 7-8, July 2006 , pp. 746-752(7)
Abstract:The product mix decision problem for semiconductor manufacturing has been extensively studied in literature. However, most of them are based on a high-yield scenario. Yet, in a low-yield manufacturing environment, some research claims that scrap low-yield lots in an early stage may produce more profit. Considering the early scrapping characteristics, this paper aims to solve the product mix decision problem for a mixed-yield scenario, which involves the simultaneous production of high-yield and low-yield products. A nonlinear mathematical program is developed to model the decision problem. Two methods for solving the nonlinear program are proposed. Method 1 converts the nonlinear program into a linear program by setting some variables as parameters. The method provides an optimal solution by exhaustively searching these parameterized variables and solving the LP models iteratively. Method 2 aims to reduce the computation complexity while providing a near optimal solution. Experiment results show that method 2 is better than method 1, when aggregately considering solution quality and computation efforts.
Document Type: Research Article
Affiliations: Email: firstname.lastname@example.org
Publication date: 2006-07-01