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Analysis of Electrostatic Offset

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In the fuser process of electro-photography, defects may be caused by a phenomenon called electrostatic offset, in which image smear is caused by toner from the fuser member adhering to the paper after one rotation of the fuser member. This toner is transferred from the paper to the fuser member by electrostatic force. The occurrence of electrostatic offset depends on the electrical resistance of the fuser member and electric potential of the fuser delivery roller. In this study, we calculated the electric field of the fuser nip region, determined the shape of the fuser nip by structural calculation, and thus clarified the micro-mechanisms by which the electrostatic offset occurs. We also found that the occurrence of electrostatic offset can be predicted by the electric field strength of the fuser nip region and the electric charge distribution of toner.
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Document Type: Research Article

Publication date: 01 January 2012

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  • For more than 30 years, IS&T's series of digital printing conferences have been the leading forum for discussion of advances and new directions in 2D and 3D printing technologies. A comprehensive, industry-wide conference that brings together industry and academia, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems?particularly those involved with additive manufacturing and fabrication?including bio-printing, printed electronics, page-wide, drop-on-demand, desktop and continuous ink jet, toner-based systems, and production digital printing, as well as the engineering capability, optimization, and science involved in these fields. In 2016, the conference changed its name formally to Printing for Fabrication to better reflect the content of the meeting and the evolving technology of printing.

    Please note: For purposes of its Digital Library content, IS&T defines Open Access as papers that will be downloadable in their entirety for free in perpetuity. Copyright restrictions on papers vary; see individual paper for details.

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