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Potential Profile Measurement and Mechanism Analysis of Electrostatic Latent Image by Detecting Primary Electrons

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A new method that makes possible a potential-profile measurement of an electrostatic latent image is proposed. The key technology is to detect a primary electron. When a surface potential is greater than acceleration voltage of the primary electron, the velocity becomes zero before the electron hits a sample. As a result, the primary electron reaches to a detector without reaching the sample. The potential distribution can be measured by detecting primary electrons while changing an applied voltage of a backside. This method is that the means of charging, exposing, and detecting are all incorporated in the same system, making real-time measurement possible.

This system is being used to analyze the basis of an electrostatic latent image formed on a photoconductor. In order to confirm a phenomenon of reciprocity law failure, the latent-image depth was measured by changing the delay time when exposure was carried out a couple of times. As a result, the latent-image depth tends to be formed deep when the delay time becomes long.

Document Type: Research Article

Publication date: January 1, 2012

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  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

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