Skip to main content

Observation of Electrostatic Latent Images and Surface Potential Measurement Using Scanning Electron Microscope

Buy Article:

$20.00 plus tax (Refund Policy)


Electrostatic voltmeters are generally used for potential measurements of electrostatic latent images. In this study, we are using SEM (Scanning Electron Microscope) for more detailed observation and potential measurement of electrostatic latent images; SEM can visualize electrostatic latent images as an image brightness distribution. We focused on clarification of the relation between surface potential of electrostatic latent image and brightness of SEM images. Electrostatic latent images were formed on PET (Polyethylene terephthalate) film by a corona discharger. We have observed SEM images of the electrostatic images after measuring surface potential of each latent image by using electrostatic voltmeters. We then measured distributions of brightness of the SEM images. We have successfully shown the relation between the surface potential and the brightness of SEM images. We hope SEM observation can be an alternative method for detail observations and measurements of electrostatic latent images.

Document Type: Research Article

Publication date: January 1, 2012

More about this publication?
  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

  • Information for Authors
  • Submit a Paper
  • Subscribe to this Title
  • Membership Information
  • Terms & Conditions
  • Ingenta Connect is not responsible for the content or availability of external websites

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Partial Open Access Content
Partial Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more