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Calibration Technique for Accurate Diode to Diode Spacing Measurements

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Diode to diode spacing is critical for high resolution print quality in electrophotographic printing. Small errors in spacing, smaller than the accuracy of current measurement equipment, can create beats in halftone screens leading to pronounced banding defects. High accuracy measurement techniques using mathematical analysis of lower resolution data have been reported. These techniques are contingent on accurate calibration of spatial quantum efficiency of measurement cameras which in turn depend on light/bright field irradiance calibration. An inexpensive but uniform light source design and the resulting data for light field calibration are described. Dark field calibration is also discussed, but has a smaller impact on the diode to diode spacing measurement.
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Document Type: Research Article

Publication date: 2011-01-01

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  • For more than 30 years, IS&T's series of digital printing conferences have been the leading forum for discussion of advances and new directions in 2D and 3D printing technologies. A comprehensive, industry-wide conference that brings together industry and academia, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems?particularly those involved with additive manufacturing and fabrication?including bio-printing, printed electronics, page-wide, drop-on-demand, desktop and continuous ink jet, toner-based systems, and production digital printing, as well as the engineering capability, optimization, and science involved in these fields. In 2016, the conference changed its name formally to Printing for Fabrication to better reflect the content of the meeting and the evolving technology of printing.

    Please note: For purposes of its Digital Library content, IS&T defines Open Access as papers that will be downloadable in their entirety for free in perpetuity. Copyright restrictions on papers vary; see individual paper for details.

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