Calibration Technique for Accurate Diode to Diode Spacing Measurements
Abstract:Diode to diode spacing is critical for high resolution print quality in electrophotographic printing. Small errors in spacing, smaller than the accuracy of current measurement equipment, can create beats in halftone screens leading to pronounced banding defects. High accuracy measurement techniques using mathematical analysis of lower resolution data have been reported. These techniques are contingent on accurate calibration of spatial quantum efficiency of measurement cameras which in turn depend on light/bright field irradiance calibration. An inexpensive but uniform light source design and the resulting data for light field calibration are described. Dark field calibration is also discussed, but has a smaller impact on the diode to diode spacing measurement.
Document Type: Research Article
Publication date: January 1, 2011
For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.
Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.
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