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Measurement of Diode to Diode Spacing

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Laser printers with multiple laser diodes in a single diode package may have diode to diode spacing requirements critical to print quality. Standard off-the-shelf equipment is seldom designed to measure to the nanometer resolutions and linearity desired, especially if the measurements are time constrained. Therefore characterizing the linearity of the measurement system is important to the understanding of the measurement system limitations.

Diode to diode spacing is a comparison of the centroids of multiple adjacent laser spots in one or more axes. It is physically possible to measure the centroid location of the spots using various methods including scanning aperture, CCD/CMOS cameras or position sensing devices. The accuracies and precisions desired for good measurements as well as for good manufacturing process capabilities are often smaller than what are easily available with these products, often by an order of magnitude.

A procedure has been developed to estimate the measurement system error over a wide range of scales. It can be applied to several of the common laser spot centroid measurement devices enabling estimation of measurement resolution of the relative centroid. This method is based on an innovative technique involving controllable movement on a much larger scale.

Document Type: Research Article

Publication date: January 1, 2010

More about this publication?
  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

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