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Method of Patching Element Defects by Ink-Jet Printing for Polymer Light Emitting Diodes

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The innate character of ink-jet instability causes the device defect in manufacturing for polymer light emitting diodes (PLED). This study develops image process skill to identify defect location; these skills include the filtering, color processing, background subtraction, dilation etc. Combination with the defect information and the predetermined head library, the ink-jet amount to patch defects can be appropriately estimated. Besides, an optimal printing route has designed with a special head driving of pre-oscillation during motion intermission. By this methodology, a 60 pL drop size from ink jet nozzle can precisely patch the PLED panel with pixel resolution of 240*73 μm, the QCIF standard. This ink-jet manufacture skill use for patch defects can increase the yield rate on line.
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Document Type: Research Article

Publication date: 2004-01-01

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  • For more than 30 years, IS&T's series of digital printing conferences have been the leading forum for discussion of advances and new directions in 2D and 3D printing technologies. A comprehensive, industry-wide conference that brings together industry and academia, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems?particularly those involved with additive manufacturing and fabrication?including bio-printing, printed electronics, page-wide, drop-on-demand, desktop and continuous ink jet, toner-based systems, and production digital printing, as well as the engineering capability, optimization, and science involved in these fields. In 2016, the conference changed its name formally to Printing for Fabrication to better reflect the content of the meeting and the evolving technology of printing.

    Please note: For purposes of its Digital Library content, IS&T defines Open Access as papers that will be downloadable in their entirety for free in perpetuity. Copyright restrictions on papers vary; see individual paper for details.

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