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Analysis of Development Uniformity in Two-Component Development System

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The method of evaluating development uniformity in twocomponent development system is proposed. Conventionally, it was known that the arrangement of the magnetic brush has influence on image quality. But there are few experimental approaches to quantification of these factors because of the difficulty of the direct observation at development area. Therefore, we pay our attention to the toner pattern generated on a photoconductor. In this method, a photoconductor, on which a solid pattern is developed previously, is prepared, and next, the sleeve and the photoconductor are settled with an interval of development gap. Then, voltage is applied to remove the toner from the photoconductor. As a result, a toner removed pattern can be obtained on the photoconductor. By analyzing this pattern, carrier contact ratio during the developing time is calculated, and some indexes of development uniformity are proposed. It is possible to evaluate the effects of parameters related to the arrangement of magnetic brush, and parameters related to the number of contact times. The relationship between the development uniformity and graininess is measured and it is shown that the proposed method is effective to estimate the graininess.

Document Type: Research Article

Publication date: January 1, 2003

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  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

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