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Numerical Simulation of Charging Characteristics under the Influence of Photoreceptor Defects

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Abstract:

Two-dimensional numerical study was carried out on the problem in charging known as the pin-hole leak phenomenon caused by photoreceptor defects in the roller charging system under constant current control with the DC voltage superposed on the AC voltage applied using the finite difference method in the generalized coordinate system. In this simulation, the pin-hole leak phenomenon was numerically reproduced by constructing a roller charging system model with photoreceptor defects and its mechanism was clarified. Further, the effects of the BCR (Biased Charging Roller) parameters to reduce the size of the image defect were quantitatively investigated. Consequently, it was suggested that larger BCR resistivity and higher AC frequency were both effective.

Document Type: Research Article

Publication date: 2002-01-01

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  • For more than 30 years, IS&T's series of digital printing conferences have been the leading forum for discussion of advances and new directions in 2D and 3D printing technologies. A comprehensive, industry-wide conference that brings together industry and academia, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems?particularly those involved with additive manufacturing and fabrication?including bio-printing, printed electronics, page-wide, drop-on-demand, desktop and continuous ink jet, toner-based systems, and production digital printing, as well as the engineering capability, optimization, and science involved in these fields. In 2016, the conference changed its name formally to Printing for Fabrication to better reflect the content of the meeting and the evolving technology of printing.

    Please note: For purposes of its Digital Library content, IS&T defines Open Access as papers that will be downloadable in their entirety for free in perpetuity. Copyright restrictions on papers vary; see individual paper for details.

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