Skip to main content

Metrology of Small Scale Features in Electrophotographic Non-Image Areas as Forensic Evidence

Buy Article:

$20.00 plus tax (Refund Policy)


The forensic community has traditionally relied on the qualitative examination of large-scale features for the identification of the electrophotographic device which produced a document. When no such large-scale features are present on a document, identification of the electrophotographic device which produced it is not usually possible. The following is a qualitative description of a proposed feasibility study to determine whether or not the small-scale features in non-image areas can be quantified for identification purposes.

Document Type: Research Article

Publication date: January 1, 2001

More about this publication?
  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

  • Information for Authors
  • Submit a Paper
  • Subscribe to this Title
  • Membership Information
  • Terms & Conditions
  • Ingenta Connect is not responsible for the content or availability of external websites

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more