Characterization of Semi-insulator Devices in Electrophotography with Corona Charging Current Measurements
Abstract:The “Electrostatic Charge Decay” (ECD) technique, previously introduced for electrical characterization of semi-insulating devices in electrophotography, involves open-circuit voltage measurements of corona charged layer as a function of time and/or position. The interpretation of data is based on first-principle charge transport theory. This provides information more relevant to the performance of the devices in electrophotographic applications. In the present work, the technique is extended by including the measurements of corona charging currents. The steady state values of charging current allow a more precise determination of charge injection properties. In addition, the key parameters can be consolidated into an effective resistance that can be used as a figure of merit for routine quality control purposes. Representative examples of characterization are presented for demonstration.
Document Type: Research Article
Publication date: 2001-01-01
For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.
Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.
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