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Space Charge Limited Currents from a Strip Shaped Emitter in a Parallel Plate Geometry

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Abstract:

Microscopic electrical defects in the photoreceptor termed Charge Deficient Spots (CDSs) can give rise to objectionable print defects in xerographic systems such as laser printers. Theoretical calculations of Space Charge Limited Currents (SCLC) between concentric cylindrical and spherical electrodes show that a finite SCLC can be sustained, for a finite applied voltage, even as the radius of the emitting electrode goes to zero. Numerical simulations of the SCLC in a model system consisting of a ground plane with a finite circular emitting region and a parallel collector kept at constant applied potential have shown that the SCLC varies linearly with emitter radius for small radii. In this paper we consider the emitting region to be an infinitely long strip of finite width, which may be termed a Charge Deficient Line (CDL). Using the same numerical technique, we address the following questions: i) does the current vanish as the width of the CDL vanishes and ii) what is dependence of the current on the width? Finite element methods were used to calculate the SCLC consistent with Maxwell's equations and the correct boundary conditions. Our results show that, for a fixed applied voltage, the SCLC varies linearly with emitter width for large width and becomes independent of width for small width.

Document Type: Research Article

Publication date: 2000-01-01

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  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

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