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Charge Injection at the Metal/Organic Interface

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Measurements of charge injection from Indium Tin Oxide (ITO) to the organic semiconductor tetraphenyl diamine doped polycarbonate (PC:TPD) were carried out. The current injected at the contact was measured as a function of the hole mobility in the organic semiconductor, which was varied from 10-6 to 10-3 cm2/V┬Ěsec by adjusting the relative TPD to PC concentration. These experiments reveal that the current injected at the contact is proportional to the hole mobility in the bulk. As a result, the ITO/PC:TPD contact is found to limit current flow in all samples, regardless of the hole mobility in PC:TPD.
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Document Type: Research Article

Publication date: 2000-01-01

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