Skip to main content

Electromigration in TaAl Thin Film Heater Material

Buy Article:

$20.00 plus tax (Refund Policy)


Electromigration is usually observed in metal conductive lines of electronics chips. However, under conditions of high temperature and high current density, electro-migration will also occur in thin film resistor material. The electromigration in a thin film resistor will cause resistance degradations and result in resistor opens.

In this paper, electromigration failure mechanism in TaAl thin film resistor is discussed based on microstructural analysis. In addition, resistance degradations due to electromigration are characterized, and a model based on experimental data is generated to quantitatively describe this new phenomenon.

Document Type: Research Article

Publication date: January 1, 2000

More about this publication?
  • For more than 25 years, NIP has been the leading forum for discussion of advances and new directions in non-impact and digital printing technologies. A comprehensive, industry-wide conference, this meeting includes all aspects of the hardware, materials, software, images, and applications associated with digital printing systems, including drop-on-demand ink jet, wide format ink jet, desktop and continuous ink jet, toner-based electrophotographic printers, production digital printing systems, and thermal printing systems, as well as the engineering capability, optimization, and science involved in these fields.

    Since 2005, NIP has been held in conjunction with the Digital Fabrication Conference.

  • Information for Authors
  • Submit a Paper
  • Subscribe to this Title
  • Membership Information
  • Terms & Conditions
  • ingentaconnect is not responsible for the content or availability of external websites

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more