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Evanescent Wave Based System for Observing Particle-Substrate-Charge Interactions

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A system using interaction of evanescent light waves with particles in a liquid allows one to observe accumulation, stability, and adhesion of such particles at and in the vicinity of a surface. Accumulation can be due to electrophoresis, sedimentation, or equilibration of the substrate surface with the bulk solution. The observation is sensitive only to particles within 1 μm of the interface, so it can be made with an arbitrary thickness of fluid. Evanescent wave absorption is monitored adjacent to an indium tin oxide coated glass slide affixed to a high index prism. The test fluid can be either constrained by a secondary metal electrode or left as a free fluid film. In the latter case a free charge can be injected into the system from an external charge generator allowing one to separate field- and charge-induced effects. This system is ideal for investigating device life limiting interactions between colorants and substrates in displays.
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Document Type: Research Article

Affiliations: Hewlett-Packard, 1501 Page Mill Rd., Palo Alto, California 94304

Publication date: 01 May 2011

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  • The Journal of Imaging Science and Technology (JIST) is dedicated to the advancement of imaging science knowledge, the practical applications of such knowledge, and how imaging science relates to other fields of study. The pages of this journal are open to reports of new theoretical or experimental results, and to comprehensive reviews. Only original manuscripts that have not been previously published, nor currently submitted for publication elsewhere, should be submitted.

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