The introduction of iodide into (111) AgBr platelet crystals is known to induce the formation of structural defects, as well as enhance the photographic response of the resulting AgBrI. The incorporation of iodide, introduced uniformly during crystal growth, has been reported to form
internal stacking faults, and more recently dislocation arrays. By using thermal processing to induce structural defects to regrow back into their matrix, it is possible to use this technique to probe specific defect characteristics, often at the microstructure level. In this article, we reported
a detailed study of two iodide induced defects in (111) AgBrI crystals, using electron microscopy, to determine their location and structural characteristics, as well as to estimate their enthalpy of activation.
Document Type: Research Article
Publication date: May 1, 2001
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The Journal of Imaging Science and Technology (JIST) is dedicated to the advancement of imaging science knowledge, the practical applications of such knowledge, and how imaging science relates to other fields of study. The pages of this journal are open to reports of new theoretical or experimental results, and to comprehensive reviews. Only original manuscripts that have not been previously published, nor currently submitted for publication elsewhere, should be submitted.