The Journal of Imaging Science and Technology (JIST) is dedicated to the advancement of imaging science knowledge, the practical applications of such knowledge, and how imaging science relates to other fields of study. The pages of this journal are open to reports of new theoretical or experimental results, and to comprehensive reviews. Only original manuscripts that have not been previously published, nor currently submitted for publication elsewhere, should be submitted.

Publisher: Society for Imaging Science and Technology

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Number 3, May/June 2000

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General Papers

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Organic Photosensor in Elgraphy (II): Photoinduced Current Amplifying Layer
pp. 179-187(9)
Authors: Aoki, D.; Kashiwabara, M.; Okabe, M.; Hikosaka, S.; Inoue, E.

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An Evaluation of Image Quality for Hardcopy Based on the MTF of Paper
pp. 188-195(8)
Authors: Inoue, Shinichi; Yamazaki, Satoshi; Tsumura, Norimichi; Miyake, Yoichi

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A Viable End-Member Selection Scheme for Spectral Unmixing of Multispectral Satellite Imagery Data
pp. 196-203(8)
Authors: Saghri, John A.; Tescher, Andrew G.; Jaradi, Farid; Omran, Mohammed

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Performance Trends for Marking Technologies in Copiers and Printers
pp. 204-209(6)
Author: Hartmann, George C.

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Optical Measurements of Toner Motion in a Development Nip
pp. 210-218(9)
Authors: Mizes, Howard; Beachner, Jim; Ramesh, Palghat

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Mechanistic Studies of a New Nucleated Infectious Development System Using Pyridinium Salts
pp. 219-222(4)
Authors: Obi, Naoki; Takeuchi, Jun; DiFrancesco, A. Gary; Hailstone, Richard K.

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The Order of Addition of 4-hydroxy-6-methyl-1,3,3a,7-tetrazaindene and Dyes into Silver Chloride Emulsion
pp. 223-228(6)
Authors: Peng, Weiping; Chen, Ping; Duan, Peicheng; Zhou, Shuyun; Zheng, Deshui

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Unveiling the Composition of Sulfur Sensitization Specks by their Interaction with TAI
pp. 235-241(7)
Authors: Charlier, E.; Van Doorselaer, M.; Gijbels, R.; De Keyzer, R.; Geuens, I.

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Comprehensive Model for Sulfur Sensitization III: Sulfur-Plus-Gold Sensitization
pp. 242-249(8)
Authors: Tani, Tadaaki; Yoshida, Yuji

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Effect of Deep Electron Traps on Contrast in AgCl Emulsions
pp. 250-256(7)
Authors: Hailstone, R. K.; Vandenbroucke, D; De Keyzer, R

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A New Approach to Measuring the Fraction of Grains Developable for Polydisperse Emulsions
pp. 257-264(8)
Authors: Wen, Zhenhuan; DiFrancesco, A. Gary; Hailstone, Richard

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