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Enhanced flux pinning in MOD YBa2Cu3O7−δ films by ion milling through anodic alumina templates

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Abstract:

A straightforward and reproducible method has been developed for creating  < 100 nm wide, 400–600 nm long c-axis columnar defects in fluorine-free MOD YBCO films (∼700 nm thick) using ion milling through free-standing nanoporous anodic aluminum oxide membranes positioned in contact with the films. At 77.3 K, a moderate J c increase of ∼50% was achieved in self-field, whereas at 1 T a more than doubling of J c was observed along a b, part of this enhancement coming from uncorrelated pinning effective over all field directions. X-ray analysis confirmed an additional in-plane microstrain component which can be attributed to oxygen disorder induced during the ion milling process.

Document Type: Research Article

DOI: http://dx.doi.org/10.1088/0953-2048/25/6/065005

Publication date: June 1, 2012

iop/sust/2012/00000025/00000006/art065005
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