Scaling properties of YBa2Cu3Ox films
Abstract:An alternative simple method is proposed for analysing the scaling properties of the high-Tc superconductor cuprates. The temperature is rescaled with a parameter TR determined from the precise analysis of RH(1/T), where RH is the Hall coefficient, in the high-temperature range. To illustrate this new method, the resistivity and Hall effect data obtained on underdoped YBa2Cu3Ox epitaxial thin films are analysed. It is shown that the temperature-dependent resistivity (T), Hall coefficient RH(T) and the cotangent of the Hall angle cot H(T) of underdoped YBa2Cu3Ox can be scaled into universal curves using this parameter TR to make a linear transformation of temperature and (T), RH(T) or cotH(T).
Document Type: Research Article
Publication date: November 1, 2005