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Scaling properties of YBa2Cu3Ox films

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Abstract:

An alternative simple method is proposed for analysing the scaling properties of the high-Tc superconductor cuprates. The temperature is rescaled with a parameter TR determined from the precise analysis of RH(1/T), where RH is the Hall coefficient, in the high-temperature range. To illustrate this new method, the resistivity and Hall effect data obtained on underdoped YBa2Cu3Ox epitaxial thin films are analysed. It is shown that the temperature-dependent resistivity (T), Hall coefficient RH(T) and the cotangent of the Hall angle cot H(T) of underdoped YBa2Cu3Ox can be scaled into universal curves using this parameter TR to make a linear transformation of temperature and (T), RH(T) or cotH(T).

Document Type: Research Article

DOI: http://dx.doi.org/10.1088/0953-2048/18/11/004

Publication date: November 1, 2005

iop/sust/2005/00000018/00000011/art00004
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