Measurement of wall and domain widths in YBa₂Cu₃O_7- through x-ray diffraction: a theoretical discussion

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In this Subject: <a title="Electricity & Magnetism" href="/content/subcat;jsessionid=156tj7rr4fnpb.victoria?j_subject=227&j_availability=">Electricity & Magnetism
By this author: <a href="/search;jsessionid=156tj7rr4fnpb.victoria?option2=author&value2=Robles++JJ">Robles, J.J. ;&nbsp; Ng, H.P. ;&nbsp; <a href="/search;jsessionid=156tj7rr4fnpb.victoria?option2=author&value2=Weiss++F">Weiss, F.

Authors: Robles, J.J.; Ng, H.P.; Weiss, F.

Source: Superconductor Science and Technology, Volume 18, Number 8, August 2005 , pp. 1089-1093(5)

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Abstract:

A procedure is developed to determine the twin wall and domain widths of YBa₂Cu₃O_7- samples through x-ray diffraction. Use is made of easily implemented simulations of diffraction spectra based on an existing model of the twin wall strain. It is shown that within the range of typical values of the wall width, that is a few unit cells, the extraction of the domain width can be carried out independently of the wall strain profile considered.

Document Type: Research article

DOI: http://dx.doi.org/10.1088/0953-2048/18/8/011

Publication date: 2005-08-01