Measurement of wall and domain widths in YBa2Cu3O7- through x-ray diffraction: a theoretical discussion
Authors: Robles, J.J.; Ng, H.P.; Weiss, F.
Source: Superconductor Science and Technology, Volume 18, Number 8, August 2005 , pp. 1089-1093(5)
Publisher: IOP Publishing
Abstract:A procedure is developed to determine the twin wall and domain widths of YBa2Cu3O7- samples through x-ray diffraction. Use is made of easily implemented simulations of diffraction spectra based on an existing model of the twin wall strain. It is shown that within the range of typical values of the wall width, that is a few unit cells, the extraction of the domain width can be carried out independently of the wall strain profile considered.
Document Type: Research article
Publication date: 2005-08-01