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Microwave impedance characterization of large-area HTS films: a novel approach

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We recently reported a method for measuring the microwave surface resistance (Rs) of large-area HTS films. The device was formed from a sapphire quasi-optical dielectric resonatorĀ (QDR) with conducting end-platesĀ (CEP). In the present work, Rs-measurement procedures and data obtained under different conditions are systematically analysed. The accuracy and the sensitivity of the Rs-measurement are analysed. The results of the study clearly demonstrate that the proposed technique provides a sensitivity which is increased by at least one order in comparison with the most accurate cavity resonator techniques in the millimetre wave range. In addition, the first experimental results on the temperature dependence of the QDR resonances with different CEP (HTS and/or Cu) are discussed in terms of a surface reactance (Xs) measurement.

Document Type: Research Article


Publication date: July 1, 2004

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