Preparation and superconducting properties of double-sided Tl-2212 thin films on LaAlO3 substrates with low temperature and long time annealing

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Double-sided Tl2Ba2CaCu2O8 (Tl-2212) thin films have been prepared on lanthanum aluminate (LaAlO3) substrates by a two-step method in which Tl-free amorphous Ba2CaCu2Ox precursor films were first deposited on the substrates by pulsed laser deposition (PLD) and the subsequent thalliation, crystallization and oriented growth of the superconducting Tl-2212 films were obtained in a long-duration annealing process in argon atmosphere at temperature around 730–750 °C. The films were characterized by means of x-ray diffraction (XRD), electron simulated x-ray microanalysis in the energy dispersive mode (EDX), scanning electron microscopy (SEM) and transport measurements. The results show that the as-prepared films are predominately single phase, except for the presence of some submicron particles on the film surface. The films show epitaxial growth with c-axis perpendicular to the substrate surface, as confirmed by XRD. The full width at half maximum (FWHM) of the (0012) peak determined from the rocking curves is 0.92° and 1.21° for the two sides of a double-sided Tl-2212 film, respectively. The zero-resistance transition temperature (TC0) is 108.8 K for one side and 106.7 K for the other side of the film. The critical current density (JC) is in excess of 106 A cm-2 for both sides of the films.

Document Type: Research Article


Publication date: June 1, 2004

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