Potential applications of a scanning tunnelling microscope with a superconducting tip
Source: Superconductor Science and Technology, Volume 15, Number 3, 2002 , pp. 446-450(5)
Publisher: IOP Publishing
We discuss the potential applications of the scanning tunnelling microscope (STM) with the superconducting tip. A number of set-ups are considered. The theoretical models are used to calculate the dependence of the measurable quantities on the bias voltage and other relevant parameters. Anticipated results include the position-resolved measurement of primary and secondary components of the superconducting order parameter on the surface, single-spin relaxation time measurements and, possibly, an effective spin-polarized STM.
Document Type: Miscellaneous
Affiliations: 1: Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA 2: Condensed Matter Theory, Department of Physics, Royal Institute of Technology - SCFAB, SE-10691 Stockholm, Sweden
Publication date: 2002-01-01