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Potential applications of a scanning tunnelling microscope with a superconducting tip

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We discuss the potential applications of the scanning tunnelling microscope (STM) with the superconducting tip. A number of set-ups are considered. The theoretical models are used to calculate the dependence of the measurable quantities on the bias voltage and other relevant parameters. Anticipated results include the position-resolved measurement of primary and secondary components of the superconducting order parameter on the surface, single-spin relaxation time measurements and, possibly, an effective spin-polarized STM.

Document Type: Miscellaneous

Affiliations: 1: Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA 2: Condensed Matter Theory, Department of Physics, Royal Institute of Technology - SCFAB, SE-10691 Stockholm, Sweden

Publication date: March 1, 2002


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