Skip to main content

High-temperature superconducting edge junctions with modified interface barriers

Buy Article:

$43.90 plus tax (Refund Policy)

Abstract:

This paper summarizes our recent investigations on the fabrication process, microstructure, and characteristics of high-temperature superconducting edge-type Josephson junctions with modified interface barriers. The junctions were fabricated by an in situedge fabrication process using an epitaxial insulator layer as an etching mask. The barriers were formed not by intentional deposition but by interface modification. The modified interface barrier material was identified as a Ba-based perovskite: Ba(Y1-xCux)Oy. The junctions showed resistively and capacitively shunted junction-like current-voltage characteristics and excellent uniformity. 100 junctions showed a spread in the critical current as low as 1= 8% at 4.2 K and the junction characteristics remained the same after a high-temperature process at about 700 °C.

Document Type: Miscellaneous

Affiliations: 1: Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan 2: Superconductivity Research Laboratory, ISTEC, 10-13, Shinonome 1, Koto-ku, Tokyo 135-0062, Japan

Publication date: January 1, 2000

iop/sust/2000/00000013/00000001/art00312
dcterms_title,dcterms_description,pub_keyword
6
5
20
40
5

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more