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Publisher: IOP Publishing

Volume 12, Number 6, December 2003

Study of a new application form of shape memory alloy superelasticity
pp. N14-N23(10)
Authors: Yan, XiaoJun; Nie, JingXu

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Preparation and characterization of activated carbons made up from different woods by chemical activation with H3PO4
pp. N24-N28(5)
Authors: Macías-García, A; Díaz-Díez, M A; Gómez-Serrano, V; González, M C Fernández

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Characterization of the response of fibre Bragg grating sensors subjected to a two-dimensional strain field
pp. 925-934(10)
Authors: Bosia, Federico; Giaccari, Philippe; Botsis, John; Facchini, Mauro; Limberger, Hans G; Salathé, René P

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Carbon nanotube/PMMA composite thin films for gas-sensing applications
pp. 935-939(5)
Authors: Philip, Biju; Abraham, Jose K; Chandrasekhar, Anupama; Varadan, Vijay K

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Thermomechanical recovery couplings of shape memory polymers in flexure
pp. 947-954(8)
Authors: Liu, Yiping; Gall, Ken; Dunn, Martin L; McCluskey, Patrick

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Elastic waves in a functionally graded piezoelectric cylinder
pp. 962-971(10)
Authors: Han, X; Liu, G R

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Electroelastic field concentration by circular electrodes in piezoelectric ceramics
pp. 972-978(7)
Authors: Yoshida, M; Narita, F; Karaiwa, M; Horiguchi, K; Shindo, Y

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Design of fuzzy controller for smart structures using genetic algorithms
pp. 979-986(8)
Authors: Lu, Qing; Peng, Zhike; Chu, Fulei; Huang, Jingyuan

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Development and technology of doped sol–gel derived lead zirconate titanate fibers
pp. 987-992(6)
Authors: Helbig, J; Glaubitt, W; Spaniol, H; Vierhaus, P; Lange, U; Hansch, R; Watzka, W; Sporn, D

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Reliability of piezoceramic patch sensors under cyclic mechanical loading
pp. 993-996(4)
Authors: Thielicke, Bärbel; Gesang, Thomas; Wierach, Peter

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Non-destructive characterization of smart CFRP structures
pp. 997-1004(8)
Authors: Mook, Gerhard; Pohl, Juergen; Michel, Fritz

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Development and manufacture of an adaptive lightweight mirror for space application
pp. 1005-1016(12)
Authors: Dürr, Johannes K; Honke, Robert; Mathias von Alberti; Sippel, Rudolf

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Young's modulus measurements of silicon nanostructures using a scanning probe system: a non-destructive evaluation approach
pp. 1028-1032(5)
Authors: Virwani, Kumar R; Malshe, A P; Schmidt, W F; Sood, D K

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Author index with titles
pp. 1033-1037(5)

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