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Volume 62, Number 3, 1999

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Application of finite element methods to the simulation of semiconductor devices
pp. 277-353(77)
Authors: Miller, J.J.H.; Schilders, W.H.A.; Wang, S.

X-ray holography
pp. 355-393(39)
Authors: Faigel, G.; Tegze, M.

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Authors: Arnould, M.; Takahashi, K.

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