Application of projection image of end mill to monitor its behaviour
Authors: Dunwen, Zuo1; Yoshihiro, Kawano2
Source: International Journal of Computer Applications in Technology, Volume 28, Number 1, 6 February 2007 , pp. 69-73(5)
Publisher: Inderscience Publishers
Abstract:
End mills with smaller diameter have found their wide application with the development of high-speed cutting. It becomes more and more important to develop effective methods to monitor and control the milling process with small end mills. In this paper, a measuring system of projection image for small end mills is introduced, and the application of the projection image to monitor the behaviour of the end mill is discussed. It is found that for static state of φ2 mm end mill, the measurement accuracy of its image width can be easily controlled within 1 μm. When the end mill rotates, it is not so difficult to control the accuracy within 3 μm. By using the change in the image width, the radial wear of the end mill can be estimated. On the other hand, if the centre shift of the image is premeasured the deflection of the end mill during cutting can be estimated.Keywords: COMPUTING JOURNALS; Computing Science, Applications and Software; TECHNICAL JOURNALS; Materials and Manufacturing; Simulation and Modelling
Document Type: Research article
DOI: http://dx.doi.org/10.1504/IJCAT.2007.012333
Affiliations: 1: College of Mechanical and Electrical Engineering, Nanjing University of Aeronautics and Astronautics (NUAA), Nanjing 210016, PR China. 2: Department of Electronic Control, Kagoshima National College of Technology (KNCT), 1460-1 Shinko, Hayato-cho, Aira-gun, Kagoshima 899-5193, Japan
Publication date: 2007-02-06
- The International Journal of Computer Applications in Technology addresses issues of computer applications, information and communication systems, software engineering and management, CAD/CAM/CAE, numerical analysis and simulations, finite element methods and analyses, robotics, computer applications in multimedia and new technologies, computer aided learning and training.
- In this: publication
- By this: publisher
- In this Subject: Computer and Information Sciences , Technology
- By this author: Dunwen, Zuo ; Yoshihiro, Kawano

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