Time-of-flight mass spectrometry (concepts, achievements, and prospects)

Author: Mamyrin B.A.¹

Source: International Journal of Mass Spectrometry, Volume 206, Number 3, 22 March 2001 , pp. 251-266(16)

Publisher: Elsevier

Keywords: TOF mass spectrometry; Reflectron; Resolution; Sensitivity; Magnetic resonance mass spectrometer; Application in research

Language: English

Document Type: Research article

DOI: 10.1016/S1387-3806(00)00392-4

Affiliations: 1: aA.F. Ioffe Physico-Technical Institute, Russian Academy of Sciences, Polytechnicheskaya 26, 194021, , St. Petersburg, Russia

Links for this article

http://www.ingentaconnect.com/els/13873806/2001/00000206/00000003/art00392
http://openurl.ingenta.com/content?genre=article&issn=1387-3806&volume=206&issue=3&spage=251&epage=266
http://dx.doi.org/10.1016/S1387-3806(00)00392-4