Time-of-flight mass spectrometry (concepts, achievements, and prospects)

Author: Mamyrin B.A.1

Source: International Journal of Mass Spectrometry, Volume 206, Number 3, 22 March 2001 , pp. 251-266(16)

Publisher: Elsevier

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Keywords: TOF mass spectrometry; Reflectron; Resolution; Sensitivity; Magnetic resonance mass spectrometer; Application in research

Language: English

Document Type: Research article

DOI: 10.1016/S1387-3806(00)00392-4

Affiliations: 1: aA.F. Ioffe Physico-Technical Institute, Russian Academy of Sciences, Polytechnicheskaya 26, 194021, , St. Petersburg, Russia

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