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Authors: Schneider, G.A.; Felten, F.; McMeeking, R.M.
Source: Acta Materialia, Volume 51, Number 8, 7 May 2003, pp. 2235-2241(7)
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Atomic force microscopy (AFM);
Kelvin probe microscopy (KFM);
Document Type: Research Article
Advanced Ceramics Group, Technical University of Hamburg-Harburg, 21073 , Hamburg, Germany
Publication date: May 7, 2003