Authors: Monchoux, J.P.; Rabkin, E.
Source: Acta Materialia, Volume 50, Number 12, 17 July 2002, pp. 3161-3176(16)
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Atomic force microscopy (AFM);
Document Type: Research Article
Department of Materials Engineering, Technion-Israel Institute of Technology, 32000 , Haifa, Israel
Publication date: July 17, 2002