Authors: Barlow, C.Y.; Hansen, N.; Liu, Y.L.
Source: Acta Materialia, Volume 50, Number 1, 8 January 2002, pp. 171-182(12)
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Transmission electron microscopy (TEM)
Document Type: Research Article
University of Cambridge, Manufacturing Engineering, Department of Engineering, Mill Lane, CB2 1RX, Cambridge, UK
Publication date: January 8, 2002