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Direct observation of basal dislocation in sapphire by HRTEM

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Keywords: Dislocations; High temperature; High-resolution transmission electron microscopy (HRTEM); Sapphire (α-Al2O3)

Document Type: Research Article

DOI: http://dx.doi.org/10.1016/S1359-6454(01)00318-4

Affiliations: Department of Materials Science, School of Engineering, The University of Tokyo, 113-8656, Tokyo, Japan

Publication date: January 8, 2002

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