AFM characterization of the evolution of surface deformation during fatigue in polycrystalline copper

Authors: Cretegny L.; Saxena A.

Source: Acta Materialia, Volume 49, Number 18, 26 October 2001 , pp. 3755-3765(11)

Publisher: Elsevier

Keywords: Atomic force microscopy (AFM); Copper; Fatigue; Slip bands; Crack nucleation

Language: English

Document Type: Research article

DOI: http://dx.doi.org/10.1016/S1359-6454(01)00271-3

Affiliations: 1: 2School of Materials Science and Engineering, Georgia Institute of Technology, 30332-0245, Atlanta, GA, USA

Publication date: 2001-10-26

• In this: publication
• By this: publisher
• In this Subject: Materials & Manufacturing ,  Mining & Metallurgy
• By this author: Cretegny L. ;  Saxena A.

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