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Defect and electronic structure of TiSi2 thin films produced by co-sputterings. - Part II: Chemical bonding and electron energy-loss near-edge structures

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Keywords: Ab initio calculation; Electron energy loss spectroscopy (EELS); Phase transformations; Transition-metal disilicide; Transmission electron microscopy (TEM)

Document Type: Research Article

DOI: http://dx.doi.org/10.1016/S1359-6454(01)00138-0

Affiliations: 2Department of Energy Science and Technology, Kyoto University, Sakyo, 606-8501, Kyoto, Japan

Publication date: July 17, 2001

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