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Publisher: Elsevier

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Volume 49, Number 1, January 2001

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New Principal Editor
pp. v-v(1)
Author: Gschneider, K.A.

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The role of segregation in diffusion-induced grain boundary migration
pp. 1-11(11)
Authors: Brokman, A.; King, A.H.; Vilenkin, A.J.

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Microscopic computer simulations of directional coarsening in face-centered cubic alloys
pp. 53-63(11)
Authors: Gupta, H.; Weinkamer, R.; Fratzl, P.; Lebowitz, J.L.

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Modelling of the age hardening behaviour of Al-Mg-Si alloys
pp. 65-75(11)
Authors: Myhr, O.R.; Grong, O.; Andersen, S.J.

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Defect and electronic structures in TiSi2 thin films produced by co-sputtering - Part 1: Defect analysis by transmission electron microscopy
pp. 83-92(10)
Authors: Inui, H.; Hashimoto, T.; Tanaka, K.; Tanaka, I.; Mizoguchi, T.; Adachi, H.; Yamaguchi, M.

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Edge effects in thin film delamination
pp. 93-107(15)
Authors: Yu, H.; He, M.Y.; Hutchinson, J.W.

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Damage evolution during microcracking of brittle solids
pp. 127-137(11)
Authors: Zimmermann, A.; Carter, W.C.; Fuller, E.R.

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On the role of martensitic transformation on damage and cracking resistance in TRIP-assisted multiphase steels
pp. 139-152(14)
Authors: Jacques, P.; Furnemont, Q.; Pardoen, T.; delannay, F.

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A synchrotron X-ray study of a Ti/SiCf composite during in situ straining
pp. 153-163(11)
Authors: Maire, E.; Owen, A.; Buffiere, J.; Withers, P.J.

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Thermal properties of zirconia co-doped with trivalent and pentavalent oxides
pp. 169-179(11)
Authors: Raghavan, S.; Wang, H.; Porter, W.D.; Dinwiddie, R.B.; Mayo, M.J.

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