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Determination of the chemical width of grain boundaries of boron- and carbon-doped hot-pressed -SiC by HAADF imaging and ELNES line-profile

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Keywords: Electron energy loss spectroscopy (EELS); Grain boundaries; Scanning/transmission electron microscopy (STEM); Structural ceramics; Transmission electron microscopy (TEM)

Document Type: Research Article

DOI: http://dx.doi.org/10.1016/S1359-6454(99)00393-6

Affiliations: 1Ceramics Superplasticity, ICORP, JST, c/o JFCC, Nagoya, Japan

Publication date: February 25, 2000

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