Author: Wickramasinghe, H.K.
Source: Acta Materialia, Volume 48, Number 1, 1 January 2000, pp. 347-358(12)
This article is hosted on another website.
You may be required to register, activate a subscription or purchase the article before you can obtain the full text.
Atomic force microscopy (AFM);
Magnetic force microscopy (MFM);
Scanning tunneling microscopy (STM)
Document Type: Research Article
Publication date: January 1, 2000